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土柱栽培研究了施肥深度对旱地小麦花后旗叶衰老及产量的影响 ,结果表明 :较深层次 ( 2 0～ 40 cm)施肥 ,旗叶 SOD、CAT活性可保持较高水平 ,可溶性蛋白质含量降低慢 ,抑制MDA含量的产生 ,有利于延迟旗叶衰老 ;施肥过浅和施肥过深 ,旗叶衰老快 ,产量较低。从整体看 ,处理 2与处理 1及处理 4差异显著 ,与处理 3差异较少。由此认为延迟旱地小麦旗叶衰老的施肥深度应在 2 0～ 40 cm左右 ,并可据此制定管理方案 ,以获得高产高效。
Effects of fertilization depth on post-anthesis flag leaf senescence and yield of dryland wheat were studied. The results showed that the activities of SOD and CAT in flag leaf could be kept at a high level at deeper layers (20-40 cm), the content of soluble protein Slow down, inhibit the production of MDA content, is conducive to delayed flag leaf aging; over-fertilization and over-fertilization, fast flag leaf senescence, lower yield. Overall, the difference between Treatment 2 and Treatment 1 and Treatment 4 is significant, and there is little difference between Treatment 2 and Treatment 3. Therefore, it is suggested that the delay of fertilizer application on the flag leaf senescence of dryland wheat should be about 20 ~ 40 cm, and the management plan can be formulated accordingly to achieve high yield and high efficiency.