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通过制备非对称结构SOI脊型波导,设计并优化得到一个偏振相关损耗标准样品,通过与标准单模光纤耦合封装,实现了偏振相关损耗测试仪表的快速校准。该器件偏振相关损耗值为0.58dB,测量重复性相对标准差为0.02,测量不确定度为0.2dB。
By preparing SOI ridge waveguide with asymmetric structure, a polarization-dependent loss standard sample is designed and optimized. The polarization-dependent loss test meter is quickly calibrated by coupling with a standard single-mode fiber. The polarization-dependent loss of the device is 0.58dB, the relative standard deviation of measurement repeatability is 0.02, and the measurement uncertainty is 0.2dB.