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超分辨近场结构(super-RENS)技术通过在传统光盘结构中插入掩膜结构而实现近场超分辨,是目前最具实用化前景的超高密度光存储技术之一,其中掩膜层的近场光学特性是决定其光存储性能的关键。利用三维时域有限差分法(3D-FDTD)对合金掩膜的近场光强分布进行了数值仿真和分析,提出二元共晶合金薄膜在激光作用下形成的规则微结构可能是以其作为掩膜层的超分辨近场结构光盘产生较高信噪比(SNR)的原因。
Super-RENS technology is one of the most practical and promising ultra-high-density optical storage technologies by implementing near-field super-resolution by inserting a mask structure into a conventional optical disk structure, in which the mask layer Near-field optical properties determine the optical storage performance of the key. The three-dimensional finite difference time domain (3D-FDTD) is used to simulate and analyze the near-field light intensity distribution of the alloy mask. It is suggested that the regular micro-structure of the binary eutectic alloy film formed by the laser may be based on The reasons for the higher signal-to-noise ratio (SNR) of the mask’s super-resolved near-field structure discs.