论文部分内容阅读
用磁控溅射法制备了Mn含量一定、不同PtMn层厚度的Pt97 4 Mn2 6 Co磁性多层膜系列 ,通过x射线衍射对该多层膜系列进行结构分析 ;测定了不同PtMn层厚度系列样品的磁滞回线、有效垂直各向异性 ,分析了饱和磁化强度和有效垂直各向异性变化的原因 ;通过测定该多层膜体系的克尔谱 ,分析了一定波长下克尔角随PtMn层厚度变化的规律 .认为克尔角的变化是由于界面的合金化以及原子的极化减小所致 .
A series of Pt97 4 Mn2 6 Co magnetic multilayer films with certain Mn content and different PtMn layer thicknesses were prepared by magnetron sputtering. The multilayer films were analyzed by X-ray diffraction. The thickness of the PtMn layer samples The effective perpendicular anisotropy is analyzed, and the reasons for the change of saturation magnetization and effective vertical anisotropy are analyzed. By measuring the Kerr spectrum of the multi-layer film system, the Kerr angle of the multilayer film with the PtMn layer The thickness of the law of change that the change in the Kerr angle is due to the interface alloying and the reduction of atomic polarization caused.