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为满足大量U-Zr合金常规分析的需求,研究了用能量色散X射线荧光光谱(EDXRF)法测定U-Zr合金中Zr的含量。切屑样品经溶解、转移、烘干等操作后,制备出薄层样品,用于EDXRF测量。与传统方法相比,本方法简便、快速、准确,适用于Zr含量在6%~18%(质量分数,下同)范围的U-Zr合金样品的Zr含量测定,测量结果的相对标准偏差(n=6)不大于1.0%,方法扩展不确定度(k=2)不大于3%。
In order to meet the needs of routine analysis of a large number of U-Zr alloys, the content of Zr in U-Zr alloy was studied by energy dispersive X-ray fluorescence spectrometry (EDXRF). Chip samples were dissolved, transferred, dried and other operations to prepare a thin layer of samples for EDXRF measurement. Compared with the traditional method, the method is simple, rapid and accurate and is suitable for the determination of Zr content in U-Zr alloy with the Zr content in the range of 6% -18% (mass fraction, the same below). The relative standard deviation ( n = 6) is not more than 1.0%, the method of expansion uncertainty (k = 2) is not more than 3%.