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报道了用光纤马赫曾德尔干涉法测量极化聚合物电光系数的方法和原理。该方法不仅可以测量聚合物薄膜的电光系数而且可以测量聚合物波导的电光系数,并且该方法可以同时测量聚合物的电光系数张量元r13和r33。该方法最突出的优点是不必在聚合物薄膜的表面制备第二个电极,因此尤其适合于在电光聚合物试制阶段测试聚合物的电光系数。干涉仪的输出被反馈到参考臂中控制相位偏置点的压电陶瓷,从而实现对干涉仪相位偏置点的闭环控制,因此降低了对环境稳定性的要求并且提高了测量精度。实际测试了极化聚合物薄膜PMMA-DR1的电光系数张量,其测量值r13=8.3 pm/V,r33=25.7 pm/V。
The method and principle of measuring the electro-optic coefficient of polarized polymer by optical fiber Mach-Zehnder interferometry are reported. The method not only can measure the electro-optic coefficient of the polymer film but also can measure the electro-optic coefficient of the polymer waveguide, and the method can simultaneously measure the electro-optic coefficient tensor r13 and r33 of the polymer. The most outstanding advantage of this method is that it is not necessary to prepare a second electrode on the surface of the polymer film and is therefore particularly suitable for testing the electro-optic coefficient of a polymer during the trial production of electro-optic polymer. The output of the interferometer is fed back to the piezo-ceramic in the reference arm that controls the phase offset point, thereby enabling closed loop control of the interferometer phase offset point, thereby reducing the need for environmental stability and improving the measurement accuracy. The electro-optic coefficient tensor of polarized polymer film PMMA-DR1 has been actually tested. The measured values are r13 = 8.3 pm / V and r33 = 25.7 pm / V.