原子力显微镜(AFM)被广泛地用来进行纳米尺度和亚微米尺度结构材料的形貌表征,其优点是制样简单、无需进行导电处理.但当针尖与样品作用时,由于针尖自身的成像作用,导致得到的图像结果比实际结果要大,这就是针尖的放大效应.文章基于一种简单的数学模型,得到了对实测图像的修正结果.对于一般金字塔形针尖,AFM的放大作用可导致粒子尺寸比真实尺寸大近2倍.实测图像的失真状况与针尖的形状因子、粒子的分散状态等因素有关.结论与实验结果完全一致 Atomic Force Microscopy (AFM) is widely used to characterize the structure of nano-scale and sub-micron scale materials, which has the advantage of simple sample preparation and no conductive treatment, but when the tip is used with the sample, , Resulting in larger image results than the actual results, which is the magnifying effect of the tip.A simple mathematical model is used to obtain the corrected results of the measured images.For the general pyramid tip, AFM magnification can lead to particles The size is nearly 2 times larger than the real size.The distortion of the measured image is related to the shape factor of the tip, the dispersion state of the particles, etc. The conclusion is in good agreement with the experimental result