研究了导Ｈ＋离子全固态电致变色器件性能退化的内在机制，发现有两个因素导致器件性能退化：在器件褪色过程中，存在于ＷＯ３薄膜中的水份将导致ＯＨ－在ＷＯ３中积累而在其中产生碱性环境，ＷＯ３溶于碱性环境而生成钨酸盐；在较高电压作用下Ｈ２Ｏ电解释放出气体Ｈ２和Ｏ２而使膜层剥落。通过改进器件结构和改善制备工艺条件，获得了光学密度高达０．５、着色／漂白（Ｃｏｌｏｒ／Ｂｌｅａｃｈ）循环次数高达１０６以上的性能优良的长寿命导Ｈ＋全固态电致变色器件 The intrinsic mechanism of the performance degradation of H + -electron solid-state electrochromic devices was investigated and two factors were found to degrade the performance of the devices. During the device fading, the water present in the WO3 thin films would result in the accumulation of OH- in WO3 In the alkaline environment, WO3 dissolves in alkaline environment and generates tungstate; under the action of higher voltage, H2O electrolysis releases gases H2 and O2 to peel off the film. By improving the structure of the device and improving the process conditions, a long-life H + all-solid-state electrochromic device with an optical density of up to 0.5 and a color / bleach cycle up to over 106 was obtained