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研究了表面活性剂在Se和Te诱导反应中的作用 ,对反应机理进行了初步探讨。实验表明 ,在选定条件下 ,加入适量非离子表面活性剂Tween-80 ,使Te的诱导反应速度加快 ,灵敏度提高 1倍 ,并利用其对Se有抑制反应速度的作用 ,使Te对Se的抗干扰能力增强。阴离子表面活性剂十二烷基苯磺酸钠对Se和Te均有加速反应的作用 ,Se的灵敏度提高 1 .3倍 ;Te的灵敏度提高40 %。基于此 ,所建立的方法可用于地质样品中纳克级Se和Te的测定。测定Te的线性范围 0 .0 1～ 0 .4μg/L ,相对标准偏差 (n =5) 5.6 % ;测定Se的线性范围 0 .1～ 2 μg/L ,相对标准偏差 (n =5)7.5%。经 4种地质标样分析验证 ,结果与标准值相符。
The role of surfactants in the induction of Se and Te was studied. The reaction mechanism was discussed. Experiments show that under the selected conditions, adding appropriate amount of non-ionic surfactant Tween-80, the Te induced by the reaction speed, sensitivity increased by 1 times, and its use of Se on the inhibition of the reaction rate, so that Te on the Se Anti-interference ability. The anionic surfactant sodium dodecyl benzene sulfonate has an accelerated reaction on Se and Te, the sensitivity of Se increased by 1.3 times, and the sensitivity of Te increased by 40%. Based on this, the established method can be used for the determination of nanogram Se and Te in geological samples. The linear range of Te was 0. 01 ~ 0. 4 μg / L and the relative standard deviation (n = 5) was 5.6%. The linear range of Se was 0. 1 ~ 2 μg / L and the relative standard deviation was 7.5 %. After four kinds of geological standard sample analysis and verification, the result is consistent with the standard value.